美国标准及美国可靠性标准
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UL 20-2000 General-Use Snap Switches
UL 44-2002 Thermoset-Insulated Wires and Cables
UL 45-2000 Safety for Portable Electric Tools
UL 62-2001 软线和装置线(中文).rar
UL 94-1998 Test for Flammability of Plastic Materials for Parts in Devices and Appliances
UL 94- 中文
UL 130-2001 Electric Heating Pads
UL 310-2001 Electrical Quick-Connect Terminal
UL 496-2000 Edison-Base Lampholders
UL 498-1999 Attachment Plugs and Receptacles
UL 508 Industrial Control Equipment
UL 746A-2003 Polymetic Materials-Short Term Property Evaluations
UL 746B-2001 Polymeric Materials-Long Term Property Evaluations
UL 746C-2001 Polymetic Materials-Use in Electrical Equipment Evaluations
UL 746D-2003 Polymeric Materials-Fabricated Parts
UL 758-2002 Appliance Wiring Material
UL 796-2001 Printed-Wiring Boards
UL 817-2001 Cords Sets and Power-Supply Cords
UL 943-2002 Groun-Fault Circuit-Interrupters
UL 982-1998 Motor-Operated Household Food Preparing Machines
UL 1012-2000 Power units other than class
UL 1026-2002 Electric Household Cooking and Food Serving Appliances
UL 1446-2005 Systems of Insulating Materials-General
UL 1642-1995 Lithium Batteries
UL 1977-1999 Component Connectors for Use in Data,Signal,Control and Power Applications
UL 2054-1999 Household and Commercial Batteries
UL 2111-2002 Overheating Protection for Motors
ASTM F 792-2001e2 Evaluating the Imaging Performance of Security X-Ray Systems
ANSI HPS N43.17-202 Radiation Safety For Personnel Security Screening Systems Using X-rays
ASME B18.21.2M-1999 Lock washers (metric series)
UL 60745-2-1 Hand-held MOtor-Operated Electric Tools-Safety-Part 2-1 Particular Requierments for Drills and Impact
Drills
IEEE STD 830-1998 ASME B18.21.2M-1999 Lock washers (metric series)
IEEE std 1028-1997 IEEE Software Engineer Standards Committee of the IEEE computer Society
IEEE STD 1332-1998 IEEE Standard Reliability Program for the Development and Production of Electronic Systems
and Equipments
ANSI Z49.1-2005 Safety in welding,cutting,and Allied processes
FCC Part18(2004) (北美认证标准)Industrial scientific and medical equipment
Mil-Hdbk-108 03-Nov-00 12:05 6M Sampling Procedures and Tables for Life and Reliability Testing (Based on Exponential Distribution) - 29 April 1960
Mil-Hdbk-109 03-Nov-00 12:05 3M Statistical Procedures for Determining Validity of Suppliers' Attributes Inspection - 6 May 1960
Mil-Hdbk-189 03-Nov-00 12:06 5M Reliability Growth Management - 13 February 1981
Mil-Hdbk-217F(1) 03-Nov-00 12:06 3M Reliability Prediction of Electronic Equipment - Notice 1 - 10 July 1992
Mil-Hdbk-217F(2) 03-Nov-00 12:07 6M Reliability Prediction of Electronic Equipment - Notice 2 - 28 February 1995
Mil-Hdbk-217F 03-Nov-00 12:09 15M Reliability Prediction of Electronic Equipment - Revision F - 2 December 1991
Mil-Hdbk-338B 03-Nov-00 12:09 5M Electronic Reliability Design Handbook - Revision B - 1 October 1998
Mil-Hdbk-470A 03-Nov-00 12:10 5M Designing and Developing Maintainable Products and Systems - Revision A - 4 August 1997
Mil-Hdbk-781A 03-Nov-00 12:13 27M Handbook for Reliability Test Methods, Plans, and Environments for Engineering, Development, Qualification, and Production - Revision A - 1 April 1996
Mil-Std-1344A(1) 13-Sep-01 14:18 582K Test Methods for Electrical Connectors - Notice 1 - 10 September 1980
Mil-Std-1344A(2) 13-Sep-01 14:18 290K Test Methods for Electrical Connectors - Notice 2 - 14 August 1981
Mil-Std-1344A(3) 13-Sep-01 14:18 433K Test Methods for Electrical Connectors - Notice 3 - 4 April 1983
Mil-Std-1344A(4) 13-Sep-01 14:18 295K Test Methods for Electrical Connectors - Notice 4 - 14 June 1985
Mil-Std-1344A(5) 13-Sep-01 14:18 168K Test Methods for Electrical Connectors - Notice 5 - 15 September 1993
Mil-Std-1344A 13-Sep-01 14:19 4M Test Methods for Electrical Connectors - 1 September 1977
Mil-Std-1629A(1) 03-Nov-00 12:13 882K Procedures for Performing a Failure Mode Effects and Criticality Analysis - Notice 1 - 7 June 1983
Mil-Std-1629A(2) 03-Nov-00 12:13 542K Procedures for Performing a Failure Mode Effects and Criticality Analysis - Notice 2 - 28 November 1984
Mil-Std-1629A(3) 03-Nov-00 12:13 3K Procedures for Performing a Failure Mode Effects and Criticality Analysis - Notice 3 - 4 August 1998
Mil-Std-1629A 03-Nov-00 12:14 5M Procedures for Performing a Failure Mode Effects and Criticality Analysis - Revision A - 24 November 1980
Mil-Std-471A(1) 03-Nov-00 12:14 879K Maintainability Verification/Demostration/Evaluation - Notice 1 - 10 January 1975
Mil-Std-471A(3) 03-Nov-00 12:14 7K Maintainability Verification/Demostration/Evaluation - Notice 3 - 12 June 1995
Mil-Std-471A 03-Nov-00 12:14 707K Maintainability Verification/Demostration/Evaluation - Revision A - 27 March 1973
Mil-Std-785B(1) 03-Nov-00 12:15 1M Reliability Program for Systems and Equipment Development and Production - Notice 1 - 3 July 1986
Mil-Std-785B(2) 03-Nov-00 12:15 760K Reliability Program for Systems and Equipment Development and Production - Notice 2 - 5 August 1988
Mil-Std-785B(3) 03-Nov-00 12:15 4K Reliability Program for Systems and Equipment Development and Production - Notice 3 - 30 July 1998
MIl-Std-785B 03-Nov-00 12:16 13M Reliability Program for Systems and Equipment Development and Production - Revision B - 15 September 1980
learned.doc 05-Aug-00 22:51 81K Reliability Lessons Learned by Washington, DC Chapter
simul8a.doc 05-Aug-00 22:51 81K Comparison of Reliability-Availability Mission Simulators by Reid
Name |
Description |
Mil-Hdbk-108 |
Sampling Procedures and Tables for Life and Reliability Testing (Based on Exponential Distribution) - 29 April 1960 |
Mil-Hdbk-109 |
Statistical Procedures for Determining Validity of Suppliers' Attributes Inspection - 6 May 1960 |
Mil-Hdbk-189 |
Reliability Growth Management - 13 February 1981 |
Mil-Hdbk-217F(1) |
Reliability Prediction of Electronic Equipment - Notice 1 - 10 July 1992 |
Mil-Hdbk-217F(2) |
Reliability Prediction of Electronic Equipment - Notice 2 - 28 February 1995 |
Mil-Hdbk-217F |
Reliability Prediction of Electronic Equipment - Revision F - 2 December 1991 |
Mil-Hdbk-338B |
Electronic Reliability Design Handbook - Revision B - 1 October 1998 |
Mil-Hdbk-470A |
Designing and Developing Maintainable Products and Systems - Revision A - 4 August 1997 |
Mil-Hdbk-781A |
Handbook for Reliability Test Methods, Plans, and Environments for Engineering, Development, Qualification, and Production - Revision A - 1 April 1996 |
Mil-Std-1344A(1) |
Test Methods for Electrical Connectors - Notice 1 - 10 September 1980 |
Mil-Std-1344A(2) |
Test Methods for Electrical Connectors - Notice 2 - 14 August 1981 |
Mil-Std-1344A(3) |
Test Methods for Electrical Connectors - Notice 3 - 4 April 1983 |
Mil-Std-1344A(4) |
Test Methods for Electrical Connectors - Notice 4 - 14 June 1985 |
Mil-Std-1344A(5) |
Test Methods for Electrical Connectors - Notice 5 - 15 September 1993 |
Mil-Std-1344A |
Test Methods for Electrical Connectors - 1 September 1977 |
Mil-Std-1629A(1) |
Procedures for Performing a Failure Mode Effects and Criticality Analysis - Notice 1 - 7 June 1983 |
Mil-Std-1629A(2) |
Procedures for Performing a Failure Mode Effects and Criticality Analysis - Notice 2 - 28 November 1984 |
Mil-Std-1629A(3) |
Procedures for Performing a Failure Mode Effects and Criticality Analysis - Notice 3 - 4 August 1998 |
Mil-Std-1629A |
Procedures for Performing a Failure Mode Effects and Criticality Analysis |
|
Number |
Revision |
Title |
MIL-HDBK-5H |
|
Metallic Materials and Elements(The original issue is 20 MB; Notice 1 is 42MB |
MIL-HDBK-17 |
|
Composite Materials Handbook |
Volume 1 |
F |
Polymer Matrix/Guidelines for Characterization |
Volume 2 |
F |
Polymer Matrix/Materials Propoerties |
Volume 3 |
F |
Polymer Matrix/Materials Usage, Design and Analysis |
Volume 4 |
F |
Metal Matrix Composites |
Volume 5 |
- |
Ceramic Matrix Composites |
MIL-PRF-13830 |
B |
Optical Component Inspection |
MIL-PRF-31032 |
- |
Printed Circuit Board, General Spec. |
MIL-STD-202 |
G |
Test Method Standad, Electronic Parts |
MIL-STD-461 |
E |
Control of Electromagnetic Interference |
Draft |
= |
Comparison of 461E with other standards |
| MIL-STD-750 |
D |
Notice 1 |
Notice 2 |
Notice 3 |
Notice 4 |
Notice 5 |
|
Test Method, Semiconductor Devices |
MIL-STD-810 |
F |
Test Method Standard/Env. Eng.
Tests |
MIL-STD-883 |
E |
Notice 1 |
Notice 2 |
Notice 3 |
Notice 4 |
Notice 5 |
|
Test Method Standard/Microcircuits |
MIL-STD-1246 |
C |
Notice 1 |
Notice 2 |
Notice 3 |
Notice 4 |
Notice 5 |
|
Cleanliness Levels |
|
|